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Integrated circuits testing

Focusing a laser beam on an integrated circuit enables its characterization and the simulation of specific effects.


The laser beam is focused on the circuit board by means of a microscope objective, and the system analyses through an oscilloscope, the changes in its output and in its power supply.


This information is used to identify particular areas of the circuit sensitive to radiation and thus simulate specific effects. The ATLAS-i platform provides manufacturers with a method of non-destructive testing, which yields a mapping of the integrated circuits analyzed, showing their photoelectric response to laser stimulation.


By varying parameters such as laser energy and voltage applied to the component, this technique gives access to a parametric analysis.



  • Photoelectric response analysis of electronic components
  • Sensitivity mapping of components to radiation
  • Sorting components




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