Reliability test system for laser diode qualification in pulsed or CW regime

Life-test and qualification test system for laser diode reliability evaluation in CW or pulsed regime down to 1 nanosecond. Up to 112 fully independent fibered devices are electrically, thermally and optically tested according to one or several user-programmed test scenarios.

This laser diode reliability test system has been specially designed for the qualification and test of fiber-coupled devices with the maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows to adjust precisely the temperature of each laser diode package and each laser diode chip independently. It includes several levels of secured data management to ensure data integrity even through power blackout.

Butterfly laser diodes like II-VI, Lumentum or 3SP are perfectly well tested.

These products are now offered by AeroDIODE, a new ALPhANOV spin-off company. The product manager is available to answer any technical of commercial question.

Product reference: Multidiode

Key features

From CW (Continuous Wave) down to less than 1 ns pulse width
CW-LIV and Pulsed-LIV testing to avoid thermal effects
100% independent behavior of each laser diode
Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.)
Embedded flash memory in each tray of 8 laser diodes
Programming supervisory GUI with easy-to-use graphical interface
Full laser protection with special protective window

Applications of this laser diode reliability test system includes any qualifications, life-test or Burn-in tests:

In parallel of the production process for R&D and qualification teams
At the end the laser diode production process.
After the production when considering applications requiring high reliability levels, like aerospace, nuclear plant etc.

A dedicated programming supervisory GUI with easy-to-use graphical interface lets the user have total control of all module functions independantly. It includes several libraries for software integration (LabVIEW VIs, DLLs, Hexa etc.).

Datasheet

LASER DIODE RELIABILITY TEST SYSTEM

This laser diode reliability tests system is the most complete system coming from our wide experience in pulsed laser diode drivers. If you are interested in a lower number of channels or a multichannel driver with no need for reliability testing functionalities, you may consider the following products:

Specifications

Capacity	Up to 112 fibered devices
Diode chip temperature range (°C)	10 - 55
Diode package temperature range (°C)	20 - 85
Temperature stability (Typ)	< 1 mK
Control loop	ACC, APC, LIV
Current range (CW)	1 - 2500 mA
Current range (pulsed peak current)	1 - 4000 mA
Pulse duration	0.5ns to CW
Compliance voltage (adjustable)	1 - 24 V
Pulse overshoot (adjustable)	Down to 0%
BFM/Ext photodiode measurement	Yes / Yes
Internal CW LIV / Pulsed LIV	Yes / Yes (provisional)
Current modulation	External or internal: sin/sqr/triang
Drive types	100% individual setpoints and test scenario
Laser drive current setpoint resolution	Down to 25 µA
Laser drive current stability	< 0.1 mA
Internal embedded memory (per tray of 8 diodes)	50 Go