Laser solutions for integrated circuits testing
For more than 15 years, ALPhANOV has been supporting the hardware security community by developing optical and laser solutions for integrated circuits testing.
Discover here the high quality and high precision equipments for laser fault injection, photon emission imaging and counting and thermal laser stimulation enabling the extraction of information
Our product range
Our related collaborative projects
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ASCRIPT - Safety Analysis of Integrated Circuits by PhotoThermal Effect
Developing new methods of evaluation and safety improvements for integrated circuits concerning an imaging technique that uses a laser as a heat source.
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PILAS - Advanced Laser Injection for Security Analyses
Develop an injection system and methodology for advanced multipoint faults using three to four laser beams.
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Publications
- Techniques d'attaques sans contact via la face arrière des circuits intégrés par méthodes optiques, R. SILVA LIMA - 2025
- Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations, R. Viera, J.-M. Dutertre, R. Silva Lima, M. Pommies, A. Bertrand - 2023
- Reverse-Engineering and Data Extraction from SRAM using Photon Emission Analysis, R. S. Lima, R. Viera, J.-M. Dutertre, W. Magrini, M. Pommies, et A. Bertrand - 2024
- When Data Shines - Leaking Data from Microcontrollers Through Photon Emission Analysis, R. S. Lima, R. Viera, J.-M. Dutertre, W. Magrini, M. Pommies, et A. Bertrand - 2024
